LR Top-Eye 5V LT

All Purpose 3D industrial microscope with Laser Topography ( LR Top-eye P5 LT)

All Purpose 3D industrial microscope with Laser Topography ( LR Top-eye P5 LT)
The LR (Lab-Robot ®) Top-EyeTM LT, is a high end ALL PURPOSE microscopic system which can do almost anything when it comes to optical microscopy and laser topography. The unique concept allows all sorts of samples to be analyzed without any sample preparation step. Whatever the size of the sample is, the LRTELT can adjust the optical configuration in such a way that all parts of the sample can be analyzed.
With superb optics and camera technology, magnifications up to 7000X can be attained with unbelievable high quality images. Samples can be tilted to allow all sorts of ‘hidden’ artifacts to be inspected with a simple mouse click. The fully automatic 3 axis system allows easy navigation of low and high magnification at any place of the sample. Illumination can be arranged through co-axial, ring or back light, allowing all sorts of dark field, or bright field  experiments to be carried out. The system allows  sophisticated 3D reconstruction techniques to be applied,  for  the optical microscope as well as the Laser topography and to be superposed flawlessly.  The  result of these techniques are full 3D interactive maps which allows the user to ‘walk through’ the virtual landscape. The system is ideal for add on accessories such as  heating stages and environmental chambers.

Fiber analysis of large  format sheets, Fast, Easy and Accurate!

Sample size (from small to A4)
Resolution LT:  max. 15 µm
Resolution Optical: max .6 µm
Max speed of LT: 1 A4 in 10 sec.
Max speed of Optical microscopy DFD: complete 3D reconstruction in 1 sec (for FOV  view  200 µm x 200 µm
Software: Complete  package of Mishell available:  OS: Windows 7 or Higher
Computer: AMD FX 4100, 740 NVIDIA Palit GT740 VGA/DVI/HDMI/GDDR5 2GB, 250GB SATA3 Samsung 840 EVO, Asus AM3+ SabertoothS/R/F/GBL/USB3/SATA3/DDR3/ATX, Asus AM3+ SabertoothS/R/F/GBL/USB3/SATA3/DDR3/ATX, Samsung CD/DVD drive, 700W ATX voeding, Cooler Master Elite 342 0 Watt / Zwart, 8192MB DDR3/1600 Crucial CL11



Large samples of any form
No sample preparation
From low till high magnification (7000x)
 3 fully automated motorized axes
Tilting of sample for hard to access defect inspection
Never lost navigation
Full scan of complete sample
3D reconstruction and surface profiling
Easy add on accessories (i.e. heating cooling stages)
Extremely versatile and powerful software
High throughput of any procedure
Particle counting (morphometric analysis)
Fiber analysis
Topography analysis
Superposition of layers
And many more……….

The LRTELT is a system which utilizes stereo pare Laser  topography in combination with  ultrafast 3D scanning microscopy  techniques.
With this unique combination large surfaces can be acquired extremely fast  without any compromise in quality and resolution. The technique utilizes a stereo pair camera  system with  appropriate lenses to measure the profile of the laser line. Then mathematical  processing allows the profile to be converted into a 3D map. The advantage of a stereo pair LT configuration is that artifacts are inspected from two independent points, leading to a much better representation and insight in the complexity of the sample. The motorized stages allow the operator to move instantaneously to  a certain  point of interest on the sample
The 3D Microscopy system  is realized by using  unique DFD (Depth From Defocus) techniques in combination with full automatic 3 axes stages, special optics, illumination  and proprietary image analysis software.  For material analysis  as well as for  bioluminescence applications we provide the technology to reconstruct 3D images to superb  quality .
Add on of all sorts of high end accessories: Tilting tables, robotization,  automation, rotation tables,  all sorts of illumination, i.e. .UV, VIS, IR, fluorescence, polarization, DIC , Heating stages. Micro plate, inverse microscopy, particle analysis,  fiber analysis, topography and many more. Custom built high throughput analyis.